Principles of Appearance Acquisition and Representation

Abstract

Algorithms for scene understanding and realistic image synthesis require accurate models of the way real-world materials scatter light. This study describes recent work in the graphics community to measure the spatially- and directionally-varying reflectance and subsurface scattering of complex materials, and to develop efficient representations and analysis tools for these datasets. We describe the design of acquisition devices and capture strategies for reflectance functions such as BRDFs and BSSRDFs, efficient factored representations, and a case study of capturing the appearance of human faces.

Citation Style:    Display Alpha ACM SIGGRAPH IEEEtran Publication

Principles of Appearance Acquisition and Representation. Tim Weyrich, Jason Lawrence, Hendrik P. A. Lensch, Szymon Rusinkiewicz, Todd Zickler. Foundations and Trends in Computer Graphics and Vision, Vol. 4, No. 2, pp. 75-191, 2008 (appeared in Nov 2009).Tim Weyrich, Jason Lawrence, Hendrik Lensch, Szymon Rusinkiewicz, and Todd Zickler. Principles of appearance acquisition and representation. Foundations and Trends in Computer Graphics and Vision, 4(2):75–191, 2008.Weyrich, T., Lawrence, J., Lensch, H., Rusinkiewicz, S., and Zickler, T. 2008. Principles of appearance acquisition and representation. Foundations and Trends in Computer Graphics and Vision 4, 2, 75–191.T. Weyrich, J. Lawrence, H. Lensch, S. Rusinkiewicz, and T. Zickler, “Principles of appearance acquisition and representation,” Foundations and Trends in Computer Graphics and Vision, vol. 4, no. 2, pp. 75–191, 2008. BibTeX DOI

Related Courses

Principles of Appearance Acquisition and Representation. Tim Weyrich, Jason Lawrence, Hendrik P. A. Lensch, Szymon Rusinkiewicz, Todd Zickler. Class SIGGRAPH 2008, Los Angeles, CA, August 2008.Tim Weyrich, Jason Lawrence, Hendrik Lensch, Szymon Rusinkiewicz, and Todd Zickler. Principles of appearance acquisition and representation. InSIGGRAPH ’08: ACM SIGGRAPH 2008 classes, pages 1–119, New York, NY, USA, 2008. ACM.Weyrich, T., Lawrence, J., Lensch, H., Rusinkiewicz, S., and Zickler, T. 2008. Principles of appearance acquisition and representation. In SIGGRAPH ’08: ACM SIGGRAPH 2008 classes, ACM, New York, NY, USA, 1–119.T. Weyrich, J. Lawrence, H. Lensch, S. Rusinkiewicz, and T. Zickler, “Principles of appearance acquisition and representation,” in SIGGRAPH ’08: ACM SIGGRAPH 2008 classes. New York, NY, USA: ACM, 2008, pp. 1–119. [BibTeX][Class Homepage]

Principles of Appearance Acquisition and Representation. Tim Weyrich, Jason Lawrence, Hendrik P. A. Lensch, Szymon Rusinkiewicz, Todd Zickler. Short Course ICCV 2007, Rio de Janeiro, Brazil, October 2007.Tim Weyrich, Jason Lawrence, Hendrik Lensch, Szymon Rusinkiewicz, and Todd Zickler. Principles of appearance acquisition and representation. InShort Course ICCV 2007, October 2007.Weyrich, T., Lawrence, J., Lensch, H., Rusinkiewicz, S., and Zickler, T. 2007. Principles of appearance acquisition and representation. In Short Course ICCV 2007.T. Weyrich, J. Lawrence, H. Lensch, S. Rusinkiewicz, and T. Zickler, “Principles of appearance acquisition and representation,” in Short Course ICCV 2007, Oct. 2007. [BibTeX][Course Homepage]